Premium
Emerging Electron Microscopy Techniques for Probing Functional Interfaces in Energy Materials
Author(s) -
Zachman Michael J.,
Hachtel Jordan A.,
Idrobo Juan Carlos,
Chi Miaofang
Publication year - 2020
Publication title -
angewandte chemie
Language(s) - English
Resource type - Journals
eISSN - 1521-3757
pISSN - 0044-8249
DOI - 10.1002/ange.201902993
Subject(s) - characterization (materials science) , electron energy loss spectroscopy , nanotechnology , scanning transmission electron microscopy , electron tomography , chemical physics , spectroscopy , resolution (logic) , energy filtered transmission electron microscopy , materials science , transmission electron microscopy , chemistry , computer science , physics , quantum mechanics , artificial intelligence
Interfaces play a fundamental role in many areas of chemistry. However, their localized nature requires characterization techniques with high spatial resolution in order to fully understand their structure and properties. State‐of‐the‐art atomic resolution or in situ scanning transmission electron microscopy and electron energy‐loss spectroscopy are indispensable tools for characterizing the local structure and chemistry of materials with single‐atom resolution, but they are not able to measure many properties that dictate function, such as vibrational modes or charge transfer, and are limited to room‐temperature samples containing no liquids. Here, we outline emerging electron microscopy techniques that are allowing these limitations to be overcome and highlight several recent studies that were enabled by these techniques. We then provide a vision for how these techniques can be paired with each other and with in situ methods to deliver new insights into the static and dynamic behavior of functional interfaces.