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Total Internal Reflection‐Based Extinction Spectroscopy of Single Nanoparticles
Author(s) -
Li Meng,
Yuan Tinglian,
Jiang Yingyan,
Sun Linlin,
Wei Wei,
Chen HongYuan,
Wang Wei
Publication year - 2019
Publication title -
angewandte chemie
Language(s) - English
Resource type - Journals
eISSN - 1521-3757
pISSN - 0044-8249
DOI - 10.1002/ange.201810324
Subject(s) - extinction (optical mineralogy) , optics , materials science , absorption (acoustics) , scattering , total internal reflection , nanoparticle , reflection (computer programming) , light scattering , plasmon , spectroscopy , absorption spectroscopy , optoelectronics , nanotechnology , physics , quantum mechanics , computer science , programming language
Herein we report a reflection‐mode total internal reflection microscopy (TIRM) to measure the extinction spectrum of individual dielectric, plasmonic, or light‐absorbing nanoparticles, and to differentiate absorption and scattering components from the total optical output. These capabilities were enabled via illuminating the sample with evanescent wave of which the lightpath length was comparable with the size of single nanoparticles, leading to a dramatically improved reflectance change (Δ I / I 0 ) up to tens of percent. It was further found that scattering and absorption of light contributed to bright and dark centroids, respectively, in the optical patterns of single nanoparticles, allowing to distinguish scattering and absorption components from the extinction spectrum by the use of an appropriate image processing method. In addition, wide‐field feature of TIRM enabled the studies on tens of nanoparticles simultaneously with gentle illumination.