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Scanning Electron Microscopy and X‐ray Analysis. Von R. E. Lee. Ellis Horwood, PRT Prentice Hall, Englewood Cliffs, USA, 1993. 464 S., geb. 60.00 $. – ISBN 0‐13‐813759‐5
Author(s) -
Mader Werner
Publication year - 1994
Publication title -
angewandte chemie
Language(s) - Uncategorized
Resource type - Journals
eISSN - 1521-3757
pISSN - 0044-8249
DOI - 10.1002/ange.19941061438
Subject(s) - art history , library science , humanities , art , physics , computer science