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Electronics Reliability and Measurement Technology–‐Non‐Destructive Evaluation. Edited by Joseph S. Heyman , Noyes Publications, 1988, xii, 188 pp., bound, $ 39.–.ISBN 0‐8155‐1171‐X
Author(s) -
Reiner Hans
Publication year - 1989
Publication title -
angewandte chemie
Language(s) - English
Resource type - Journals
eISSN - 1521-3757
pISSN - 0044-8249
DOI - 10.1002/ange.19891011156
Subject(s) - citation , computer science , german , reliability (semiconductor) , library science , philosophy , physics , thermodynamics , linguistics , power (physics)
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