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Scanning tunneling microscopy of RF oscillating surfaces
Author(s) -
Chilla E.,
Rohrbeck W.,
Fröhlich H.J.,
Koch R.,
Rieder K. H.
Publication year - 1994
Publication title -
annalen der physik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.009
H-Index - 68
eISSN - 1521-3889
pISSN - 0003-3804
DOI - 10.1002/andp.19945060104
Subject(s) - scanning tunneling microscope , amplitude , quantum tunnelling , wavelength , physics , phase (matter) , particle displacement , scanning tunneling spectroscopy , optics , displacement (psychology) , materials science , condensed matter physics , molecular physics , quantum mechanics , psychology , psychotherapist
Amplitude and phase of high frequency surface acoustic wave (SAW) fields are investigated by a novel scanning tunneling microscopy technique. The gap voltage is modulated at a slightly detuned high frequency. Due to the nonlinearity of the tunneling process a frequency mixing appears. For scanned areas with dimensions much smaller than the wavelength of the SAW a remarkable local variation of amplitude and phase of the tunneling current at the difference frequency is observed. Depending on the local morphology different components of the particle displacement vector are detected. Model calculations of amplitude and phase images are presented for a real topography.