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Periodische Schwankungen der Röntgen‐Reflexionsintensität von optischen Liniengittern mit der Einstrahlrichtung
Author(s) -
Weyerer H.
Publication year - 1972
Publication title -
annalen der physik
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.009
H-Index - 68
eISSN - 1521-3889
pISSN - 0003-3804
DOI - 10.1002/andp.19724830112
Subject(s) - physics , optics , grating , reflection (computer programming) , radiation , oscillation (cell signaling) , transverse plane , interference (communication) , telecommunications , chemistry , biochemistry , computer science , programming language , channel (broadcasting) , structural engineering , engineering
Ruled gratings consisting of interrupted metallic films on glass show a periodical change of X‐ray reflection power with the glancing angle of the incident beam. This oscillation is interpreted as an effect of interference between the radiation scattered in different depth of the grating lines, a kind of ”transverse structure factor”.

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