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Prospective assessment of fecundability of female semiconductor workers
Author(s) -
Eskenazi Brenda,
Gold Ellen B.,
Samuels Steven J.,
Wight Suzanne,
Lasley Bill L.,
Hammond S. Katharine,
O'Neill Rasor Marianne,
Schenker Marc B.
Publication year - 1995
Publication title -
american journal of industrial medicine
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.7
H-Index - 104
eISSN - 1097-0274
pISSN - 0271-3586
DOI - 10.1002/ajim.4700280614
Subject(s) - medicine , confidence interval , gynecology , odds ratio , obstetrics , abortion , menstrual cycle , prospective cohort study , pregnancy , hormone , genetics , biology
To investigate a possible effect of reduced fecundability (probability of conception per menstrual cycle) among women who fabricate silicon wafers, 152 fabrication‐room (fab) and 251 nonfab workers were followed for an average of five menstrual cycles. Daily urine samples were analyzed to confirm clinical spontaneous abortions (SABs) and early fetal losses (EFLs). Adjusted fecundability odds ratios (FRs) for fab workers ranged from 0.59 to 0.72 (p = 0.09‐0.28 vs. nonfab). For clinical pregnancies only, the adjusted FR ranged from 0.43‐0.50 (p = 0.04‐0.09 vs. nonfab). This lower fecundability was most pronounced among dopants and thin‐film workers [adjusted FR = 0.61, 95% confidence interval (CI) = 0.27‐1.40 for all pregnancies; adjusted FR = 0.22, 95% CI = 0.05‐0.96 for clinical pregnancies] and in workers exposed to ethylene‐based glycol ethers (adjusted FR = 0.37, 95% CI = 0.11‐1.19).