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Properties of evaporated metal films related to their use for surface temperature measurements
Author(s) -
Simpson Theodore B.,
Winding Charles C.
Publication year - 1956
Publication title -
aiche journal
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.958
H-Index - 167
eISSN - 1547-5905
pISSN - 0001-1541
DOI - 10.1002/aic.690020123
Subject(s) - inert , fabrication , evaporation , vacuum evaporation , refractory metals , materials science , metal , instrumentation (computer programming) , surface (topology) , nanotechnology , composite material , metallurgy , analytical chemistry (journal) , thin film , chemical engineering , chemistry , thermodynamics , chromatography , computer science , organic chemistry , mathematics , medicine , physics , alternative medicine , geometry , pathology , operating system , engineering
Extension of the understanding of properties of films of metals produced on glass surfaces by vacuum evaporation has permitted the fabrication of film‐resistance thermometers that with simple instrumentation accurately measure surface or average surface temperatures without altering the geography of that surface. Formerly unknown and unstabled related properties of such films have been classified and may be anticipated or eliminated by recommended experimental procedures. Films of several of the most chemically inert and refractory metals 300 to 3,000 Å. thick have been shown to attain accuracies as high as 0.01°C. for practical periods of time. Their use, which is described, is developing satisfactorily, and the technique and equipment for their preparation are relatively simple.