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Photovoltaic Devices: Electron‐Beam‐Evaporated Nickel Oxide Hole Transport Layers for Perovskite‐Based Photovoltaics (Adv. Energy Mater. 12/2019)
Author(s) -
Abzieher Tobias,
Moghadamzadeh Somayeh,
Schackmar Fabian,
Eggers Helge,
Sutterlüti Florian,
Farooq Amjad,
Kojda Danny,
Habicht Klaus,
Schmager Raphael,
Mertens Adrian,
Azmi Raheleh,
Klohr Lukas,
Schwenzer Jonas A.,
Hetterich Michael,
Lemmer Uli,
Richards Bryce S.,
Powalla Michael,
Paetzold Ulrich W.
Publication year - 2019
Publication title -
advanced energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.08
H-Index - 220
eISSN - 1614-6840
pISSN - 1614-6832
DOI - 10.1002/aenm.201970035
Subject(s) - photovoltaics , materials science , perovskite (structure) , fabrication , photovoltaic system , electron beam physical vapor deposition , evaporation , optoelectronics , nickel oxide , nickel , oxide , nanotechnology , thin film , chemical engineering , metallurgy , electrical engineering , physics , engineering , medicine , alternative medicine , pathology , thermodynamics
High‐quality inorganic charge extraction layers are of key importance for efficient and stable perovskite‐based photovoltaics. In article number 1802995 , Tobias Abzieher, Ulrich W. Paetzold, and co‐workers introduce oxygen‐assisted electron beam evaporation of NiO x as a promising approach for the fabrication of highly transparent hole transport layers. By integrating these layers in inkjet‐printed and all‐evaporated perovskite solar cells, record PCEs are achieved.