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Investigating the Effects of Chemical Gradients on Performance and Reliability within Perovskite Solar Cells with TOF‐SIMS
Author(s) -
Harvey Steven P.,
Messinger Jonah,
Zhu Kai,
Luther Joseph M.,
Berry Joseph J.
Publication year - 2020
Publication title -
advanced energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.08
H-Index - 220
eISSN - 1614-6840
pISSN - 1614-6832
DOI - 10.1002/aenm.201903674
Subject(s) - materials science , perovskite (structure) , secondary ion mass spectrometry , stack (abstract data type) , reliability (semiconductor) , solar cell , grain boundary , resolution (logic) , optoelectronics , nanotechnology , ion , analytical chemistry (journal) , chemical engineering , computer science , chemistry , composite material , microstructure , environmental chemistry , power (physics) , physics , organic chemistry , quantum mechanics , engineering , programming language , artificial intelligence
Time‐of‐flight secondary‐ion mass spectrometry (TOF‐SIMS), a powerful analytical technique sensitive to all components of perovskite solar cell (PSC) materials, can differentiate between the various organic species within a PSC absorber or a complete device stack. The ability to probe chemical gradients through the depth of a device (both organic and inorganic), with down to 100 nm lateral resolution, can lead to unique insights into the relationships between chemistry in the absorber bulk, at grain boundaries, and at interfaces as well as how they relate to changes in performance and/or stability. In this review, the technique is described; then, from the literature, several examples of how TOF‐SIMS have been used to provide unique insight into PSC absorbers and devices are covered. Finally, the common artifacts that can be introduced if the data are improperly collected, as well as methods to mitigate these artifacts are discussed.