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Sustained Water Oxidation by Direct Electrosynthesis of Ultrathin Organic Protection Films on Silicon
Author(s) -
Azarpira Anahita,
SchedelNiedrig Thomas,
Lewerenz H.J.,
Lublow Michael
Publication year - 2016
Publication title -
advanced energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.08
H-Index - 220
eISSN - 1614-6840
pISSN - 1614-6832
DOI - 10.1002/aenm.201502314
Subject(s) - materials science , photocurrent , silicon , chemical engineering , electrosynthesis , catalysis , artificial photosynthesis , layer (electronics) , polymerization , nanotechnology , electrode , polymer , electrochemistry , organic chemistry , photocatalysis , optoelectronics , chemistry , composite material , engineering
Artificial photosynthesis allows exceeding the efficiency and stability limits of natural photosynthesis. Based on the use of semiconducting absorbers, high efficiency in water photolysis has been achieved in various photoelectrode configurations. However, integrated systems are limited in their stability, and more stable half‐cell electrodes use protection films prepared by laborious methods. Herein, the facile low‐temperature preparation of ultrathin organic protection coatings is demonstrated. The formation is based on the catalytic properties of water oxidation catalysts toward alcohol‐polymerization reactions, which results in the formation of hitherto unknown protection layers on silicon. The interfacial layers are generated via iodine‐mediated electro‐reductive polymerization of ethanol, concomitantly forming during electrophoretic transport of RuO 2 onto silicon supports. Reaction chemistry analyses show that the RuO 2 ‐induced catalysis introduces E2‐elimination reactions which result in a carbon sp 3 –sp 2 transformation of the film. For the two modes of photoelectrochemical operation, the photovoltaic and the photoelectrocatalytic mode, 20 and 15 mA cm −2 photocurrent densities, respectively, are obtained with unaltered output for 8 and 24 h. The interfacial layer enables Si photovoltages of 500 mV, demonstrating extraordinary electronic interface quality. Since only hydrogen termination of the surface is a prerequisite for growth of the organic protection layer, the method is applicable to a wide range of semiconductors.