Premium
Nanoimaging of Open‐Circuit Voltage in Photovoltaic Devices
Author(s) -
Tennyson Elizabeth M.,
Garrett Joseph L.,
Frantz Jesse A.,
Myers Jason D.,
Bekele Robel Y.,
Sanghera Jasbinder S.,
Munday Jeremy N.,
Leite Marina S.
Publication year - 2015
Publication title -
advanced energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.08
H-Index - 220
eISSN - 1614-6840
pISSN - 1614-6832
DOI - 10.1002/aenm.201501142
Subject(s) - photovoltaic system , open circuit voltage , voltage , materials science , metrology , computer science , nanoscopic scale , nanotechnology , optoelectronics , electrical engineering , physics , optics , engineering
A novel imaging platform to determine the open‐circuit voltage of solar cells with nanoscale spatial resolution is presented. Here, a variant of illuminated Kelvin probe force microscopy can be implemented to quantify local variations in the voltage of different solar cells. The new metrology can be applied to any optoelectronic device, and works in ambient environments.