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SEI Growth and Depth Profiling on ZFO Electrodes by Soft X‐Ray Absorption Spectroscopy
Author(s) -
Di Cicco Andrea,
Giglia Angelo,
Gunnella Roberto,
Koch Stephan L.,
Mueller Franziska,
Nobili Francesco,
Pasqualini Marta,
Passerini Stefano,
Tossici Roberto,
Witkowska Agnieszka
Publication year - 2015
Publication title -
advanced energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.08
H-Index - 220
eISSN - 1614-6840
pISSN - 1614-6832
DOI - 10.1002/aenm.201500642
Subject(s) - materials science , x ray absorption spectroscopy , profiling (computer programming) , electrode , spectroscopy , absorption (acoustics) , analytical chemistry (journal) , x ray , x ray spectroscopy , absorption spectroscopy , optics , composite material , environmental chemistry , chemistry , computer science , physics , quantum mechanics , operating system
The evolution of the solid electrolyte interface (SEI) in carbon‐coated ZnFe 2 O 4 (ZFO‐C) anodes is studied by soft X‐ray absorption spectroscopy (XAS). Experiments probe locally the SEI growth in the 2–100 nm range, using both total electron (TEY) and total fluorescence (TFY) yield techniques. XAS analysis shows that the SEI grows preferentially around the ZFO‐C nanoparticles.