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Thin Films: Mapping Spatially Resolved Charge Collection Probability within P3HT:PCBM Bulk Heterojunction Photovoltaics (Adv. Energy Mater. 2/2014)
Author(s) -
Dissanayake D. M. Nanditha M.,
Ashraf Ahsan,
Pang Yutong,
Eisaman Matthew D.
Publication year - 2014
Publication title -
advanced energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.08
H-Index - 220
eISSN - 1614-6840
pISSN - 1614-6832
DOI - 10.1002/aenm.201470008
Subject(s) - materials science , photovoltaics , active layer , optoelectronics , photoactive layer , organic solar cell , photovoltaic system , polymer solar cell , prism , heterojunction , layer (electronics) , charge (physics) , phase (matter) , nanotechnology , solar cell , optics , polymer , organic chemistry , composite material , physics , quantum mechanics , ecology , chemistry , biology , thin film transistor
In article 1300525, D. M. Nanditha M. Dissanayake and co‐workers show that unlike the behavior observed thicknesses typically used for devices (100 nm), electron‐limited behavior is seen for a thicker active layer (920 nm) due to phase segregation in poly(3‐hexythiophene‐2,5‐diyl):phenyl‐C61‐butyric acid methyl ester (P3HT:PCBM). The illustration shows prism‐coupled guidedmodes used for spatially selective excitation in a P3HT:PCBM photovoltaic, which are used to obtain high‐resolution profiles of charge‐collection probability in the photoactive layer.

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