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The Nanoscale Morphology of a PCDTBT:PCBM Photovoltaic Blend
Author(s) -
Staniec Paul A.,
Parnell Andrew J.,
Dunbar Alan D. F.,
Yi Hunan,
Pearson Andrew J.,
Wang Tao,
Hopkinson Paul E.,
Kinane Christy,
Dalgliesh Robert M.,
Donald Athene M.,
Ryan Anthony J.,
Iraqi Ahmed,
Jones Richard A. L.,
Lidzey David G.
Publication year - 2011
Publication title -
advanced energy materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.08
H-Index - 220
eISSN - 1614-6840
pISSN - 1614-6832
DOI - 10.1002/aenm.201100144
Subject(s) - materials science , photovoltaic system , annealing (glass) , nanoscopic scale , casting , simulated annealing , neutron scattering , scattering , optoelectronics , nanotechnology , optics , computer science , composite material , physics , electrical engineering , engineering , algorithm
Neutron reflectivity and X‐ray scattering have been used to characterise the structure of photovoltaic optimised PCDTBT:PCBM (1:4) blend films. A negative gradient of the PCBM forms spontaneously upon film casting – a fortuitous structure that is well matched for efficient charge extraction. Mild thermal annealing at 70 °C does not significantly modify the film structure, and any improvement in device efficiency is likely to be through the removal of trapped casting solvent.