z-logo
Premium
Forming‐Free Grain Boundary Engineered Hafnium Oxide Resistive Random Access Memory Devices
Publication year - 2020
Publication title -
advanced electronic materials
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 2.25
H-Index - 56
ISSN - 2199-160X
DOI - 10.1002/aelm.202000098
Subject(s) - materials science , resistive random access memory , grain boundary , hafnium , resistive touchscreen , optoelectronics , oxide , random access memory , random access , engineering physics , nanotechnology , metallurgy , electrical engineering , voltage , computer science , computer hardware , operating system , zirconium , microstructure , engineering

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom