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Black Phosphorus: Thickness‐Dependent Structural Stability and Anisotropy of Black Phosphorus (Adv. Electron. Mater. 3/2019)
Author(s) -
Li Qian,
Huang Hao,
Chen Zhongwei,
Huang Xin,
Deng Kerong,
Luo Shuiping,
Wang Zhongwu,
Yu Xuefeng,
Quan Zewei
Publication year - 2019
Publication title -
advanced electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.25
H-Index - 56
ISSN - 2199-160X
DOI - 10.1002/aelm.201970012
Subject(s) - black phosphorus , materials science , anisotropy , fabrication , phosphorus , compressibility , phase diagram , electron , phosphorene , diagram , phase (matter) , condensed matter physics , optoelectronics , optics , band gap , thermodynamics , chemistry , metallurgy , physics , organic chemistry , pathology , medicine , alternative medicine , statistics , quantum mechanics , mathematics
In article number 1800712 , Zewei Quan and co‐workers study the structural variations of black phosphorus (BP) with a tunable thickness from ∼71 nm down to ∼6 nm. Both the thickness‐dependent phase diagram and anisotropic compressibility are summarized and used to construct thickness‐pressure‐structure relations. The thickness‐dependent structural responses provide valuable information towards controllable design and fabrication of BP‐based devices for applications.