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Cold‐Sintered C0G Multilayer Ceramic Capacitors
Author(s) -
Wang Dawei,
Zhou Di,
Song Kaixin,
Feteira Antonio,
Randall Clive A.,
Reaney Ian M.
Publication year - 2019
Publication title -
advanced electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.25
H-Index - 56
ISSN - 2199-160X
DOI - 10.1002/aelm.201900025
Subject(s) - materials science , ceramic capacitor , sintering , scanning electron microscope , capacitor , dielectric , raman spectroscopy , ceramic , electrode , capacitance , composite material , temperature coefficient , diffraction , analytical chemistry (journal) , optoelectronics , optics , electrical engineering , chemistry , physics , chromatography , voltage , engineering
Multilayer ceramic capacitors (MLCCs) based on (Bi 0.95 Li 0.05 )(V 0.9 Mo 0.1 )O 4 ‐Na 2 Mo 2 O 7 (BLVMO‐NMO), with ε r = 39, temperature coefficient of capacitance, TCC ≈ ±0.01%, and tan δ = 0.01 at 1 MHz, are successfully fabricated by a cold‐sintering process at 150 °C. Scanning electron microscopy of the MLCCs combined with EDS mapping, X‐ray diffraction, and Raman spectroscopy reveals well‐laminated and undistorted dielectric layers composed of BLVMO and NMO discrete phases separated by Ag internal electrodes. Prototypes show comparable properties to C0G MLCCs (TCC = ±30 ppm °C −1 from −55 to +125 °C) currently commercially fabricated at 1100 °C using CaZrO 3 ‐based dielectrics with glass sintering aids and Ni internal electrodes.