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Nanostructure Formation: Time‐Resolved Plasmonics used to On‐Line Monitor Metal/Elastomer Deposition for Low‐Voltage Dielectric Elastomer Transducers (Adv. Electron. Mater. 8/2017)
Author(s) -
Töpper Tino,
Lörcher Samuel,
Deyhle Hans,
Osmani Bekim,
Leung Vanessa,
Pfohl Thomas,
Müller Bert
Publication year - 2017
Publication title -
advanced electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.25
H-Index - 56
ISSN - 2199-160X
DOI - 10.1002/aelm.201770036
Subject(s) - materials science , elastomer , plasmon , nanostructure , optoelectronics , nanotechnology , dielectric , nanophotonics , transducer , deposition (geology) , ellipsometry , stretchable electronics , nanoelectronics , thin film , electronics , composite material , electrical engineering , engineering , paleontology , sediment , biology
Hetero‐nanostructured films are essential for developing applications in a number of areas, such as flexible electronics and nanophotonics. In article number 1700073 , Bert Müller and co‐workers describe the use of spectroscopic ellipsometry to monitor film formation in real time, with sub‐nanometer resolution. Their data show not only the plasmonic fingerprints of a number of hetro‐nanostructures, but also show how their optical properties evolve during deposition.