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An Analytical Modeling of Field Electron Emission for a Vertical Wedged Ordered Nanostructure
Author(s) -
Shen Yan,
Xu Ningsheng,
Ye Peng,
Zhang Yu,
Liu Fei,
Chen Jun,
She Juncong,
Deng Shaozhi
Publication year - 2017
Publication title -
advanced electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.25
H-Index - 56
ISSN - 2199-160X
DOI - 10.1002/aelm.201700295
Subject(s) - field electron emission , nanostructure , radius , materials science , current density , field (mathematics) , electron , common emitter , curvature , current (fluid) , radius of curvature , computational physics , enhanced data rates for gsm evolution , electron density , nanotechnology , geometry , optoelectronics , physics , mean curvature , mathematics , telecommunications , thermodynamics , computer science , computer security , quantum mechanics , mean curvature flow , pure mathematics
The development of field electron emission materials requires purposeful analytical modeling of structural features. A vertical wedged ordered nanostructure shows better field emission current density because of its in‐plane continuity at the top emission edge: Individually, its calculated average current density can be 8.3–26.7 times larger than a tapered nanostructure when its bottom area s increases from 0.5 to 2.5 µm 2 , can be 2.2–12.7 times as its radius of top curvature r decreases from 65 to 5 nm, and can be 7.3–17.3 times as its length L increases from 0.5 to 5 µm. For an ordered nanostructure array, its average current density can be about 160 times larger than the a reference tapered array when the individual elements are closely aligned. Over three orders of magnitude improvment can be observed when optimal emitter spacing conditions are used. Structural analytical models and numerical simulation prove to be in good correspondence with previously reported experimental data, and may serve as a guide for the design and preparation of field electron emission materials with a clear purpose in the future.