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Modeling of Electrical Characteristics of Degraded Polymer Light‐Emitting Diodes
Author(s) -
Niu Quan,
Wetzelaer GertJan A. H.,
Blom Paul W. M.,
Crăciun Nicoleta I.
Publication year - 2016
Publication title -
advanced electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.25
H-Index - 56
ISSN - 2199-160X
DOI - 10.1002/aelm.201600103
Subject(s) - materials science , optoelectronics , electroluminescence , luminance , degradation (telecommunications) , diode , light emitting diode , luminous efficacy , electrode , oled , charge carrier , voltage , polymer , current (fluid) , reduction (mathematics) , charge (physics) , optics , nanotechnology , electronic engineering , electrical engineering , composite material , chemistry , physics , engineering , layer (electronics) , geometry , mathematics , quantum mechanics
Degradation of a polymer light‐emitting diode (PLED) driven under constant current is characterized by an increase of driving voltage and a decrease of luminance and efficiency. Possible causes for degradation can be a decrease of charge‐carrier mobility, a reduced charge injection by the electrodes, or the formation of charge traps. In order to disentangle these processes, numerical simulations are performed on the device characteristics of pristine and degraded PLEDs. The observed reduction in transport and luminous efficiency under current stress is simultaneously explained by the formation of hole traps. A reduction of the hole transport upon degradation is verified by transient electroluminescence measurements.