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Giant Electric Energy Density in Epitaxial Lead‐Free Thin Films with Coexistence of Ferroelectrics and Antiferroelectrics
Author(s) -
Peng Biaolin,
Zhang Qi,
Li Xing,
Sun Tieyu,
Fan Huiqing,
Ke Shanming,
Ye Mao,
Wang Yu,
Lu Wei,
Niu Hanben,
Scott James F.,
Zeng Xierong,
Huang Haitao
Publication year - 2015
Publication title -
advanced electronic materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.25
H-Index - 56
ISSN - 2199-160X
DOI - 10.1002/aelm.201500052
Subject(s) - materials science , ferroelectricity , dielectric , antiferroelectricity , phase boundary , thin film , condensed matter physics , epitaxy , optoelectronics , phase (matter) , nanotechnology , chemistry , physics , organic chemistry , layer (electronics)
Ferroelectrics/antiferroelectrics with high dielectric breakdown strength have the potential to store a great amount of electrical energy, attractive for many modern applications in electronic devices and systems. Here, it is demonstrated that a giant electric energy density (154 J cm −3 , three times the highest value of lead‐based systems and five times the value of the best dielectric/ferroelectric polymer), together with the excellent fatigue‐free property, good thermal stability, and high efficiency, is realized in pulsed laser deposited (Bi 1/2 Na 1/2 ) 0.9118 La 0.02 Ba 0.0582 (Ti 0.97 Zr 0.03 )O 3 (BNLBTZ) epitaxial lead‐free relaxor thin films with the coexistence of ferroelectric (FE) and antiferroelectric (AFE) phases. This is endowed by high epitaxial quality, great relaxor dispersion, and the coexistence of the FE/AFE phases near the morphotropic phase boundary. The giant energy storage effect of the BNLBTZ lead‐free relaxor thin films may make a great impact on the modern energy storage technology.