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Probing Structural Evolution and Charge Storage Mechanism of NiO 2 H x Electrode Materials using In Operando Resonance Raman Spectroscopy
Author(s) -
Chen Dongchang,
Xiong Xunhui,
Zhao Bote,
Mahmoud Mahmoud A.,
ElSayed Mostafa A.,
Liu Meilin
Publication year - 2016
Publication title -
advanced science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.388
H-Index - 100
ISSN - 2198-3844
DOI - 10.1002/advs.201500433
Subject(s) - non blocking i/o , raman spectroscopy , materials science , electrode , spectroscopy , resonance raman spectroscopy , charge (physics) , resonance (particle physics) , analytical chemistry (journal) , chemistry , physics , optics , atomic physics , environmental chemistry , biochemistry , quantum mechanics , catalysis
In operando resonance Raman spectroscopy suggests quantitative correlation between phonon band properties and the amount of charge storage of high‐energy density NiO 2 H x battery/pseudocapacitive material. Comparing the spectroscopic evolution using different electrolytes reveals the contributions of breaking/formation of O–H bonds and insertion/extraction of cations to electrochemical charge storage of NiO 2 H x .

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