Premium
Mapping Sub‐Surface Structure of Thin Films in Three Dimensions with an Optical Near‐Field
Author(s) -
Fenwick Oliver,
Mauthoor Soumaya,
Cacialli Franco
Publication year - 2019
Publication title -
advanced theory and simulations
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.068
H-Index - 17
ISSN - 2513-0390
DOI - 10.1002/adts.201900033
Subject(s) - planar , field (mathematics) , optics , materials science , thin film , optical microscope , photonics , microscopy , surface (topology) , interface (matter) , near field scanning optical microscope , nanostructure , optoelectronics , nanotechnology , physics , computer science , scanning electron microscope , computer graphics (images) , geometry , mathematics , capillary number , capillary action , pure mathematics , composite material
Subsurface mapping is crucial to understanding many biological systems as well as structured thin films for (opto)electronic or photonic applications. A non‐invasive method is presented to map subsurface nanostructures from scanning near‐field optical microscopy images. The Bethe–Bouwkamp model is used to simulate imaging of buried nano‐objects or subsurface slanted planar interfaces, and it is shown how to determine their depth and size, or the interface inclination, from just one image. It is shown that the steep optical field gradient makes near‐field microscopy a particularly sensitive depth probe for thin films.