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Polarization‐Sensitive Ultraviolet Detection from Oriented‐CdSe@CdS‐Dot‐in‐Rods‐Integrated Silicon Photodetector
Author(s) -
Ge Yong,
Zhang Mengjiao,
Wang Lei,
Meng Linghai,
Tang Jialun,
Chen Yu,
Wang Lingxue,
Zhong Haizheng
Publication year - 2019
Publication title -
advanced optical materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.89
H-Index - 91
ISSN - 2195-1071
DOI - 10.1002/adom.201900330
Subject(s) - materials science , polarization (electrochemistry) , optoelectronics , photodetector , polyvinylidene fluoride , ultraviolet , optics , luminescence , silicon , quantum dot , wavelength , polymer , chemistry , physics , composite material
Polarization can be used to distinguish artificial objects in complicated environments. The development of polarization‐sensitive detection at ultraviolet (UV) wavelengths has been substantially delayed by the difficulties in fabricating anisotropic materials and optical elements for polarization modulation. Polarization‐sensitive UV detection is developed by combining an electron‐multiplying charge‐coupled device (EMCCD) with a polarized luminescence downshifting material that benefits from an oriented‐CdSe@CdS‐dot‐in‐rods‐embedded polyvinylidene fluoride (PVDF) composite film. With mechanical‐stretching‐induced orientation, the composite film shows emission polarization with an optimized ratio up to 0.52 ± 0.02. This integrated detection system can respond to linearly polarized 405 nm light with a signal difference up to 23%, showing its potential for use in UV polarization‐enhanced imaging for object recognition.