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Antireflectivity: Design Rules for Tailoring Antireflection Properties of Hierarchical Optical Structures (Advanced Optical Materials 13/2017)
Author(s) -
Leon Juan J. Diaz,
Hiszpanski Anna M.,
Bond Tiziana C.,
Kuntz Joshua D.
Publication year - 2017
Publication title -
advanced optical materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.89
H-Index - 91
ISSN - 2195-1071
DOI - 10.1002/adom.201770065
Subject(s) - materials science , broadband , omnidirectional antenna , nanometre , silicon , optics , rendering (computer graphics) , optoelectronics , wavelength , computer science , computer graphics (images) , telecommunications , composite material , physics , antenna (radio)
Broadband and pseudo‐omnidirectional antireflection is demonstrated with hierarchically structured silicon by Joshua D. Kuntz and co‐workers in article number 1700080 . The image is a computer rendering of the hierarchical silicon structures both fabricated and modeled that provides the best antireflectivity response across broad wavelengths and angles of incidence, which shows both length scales of the structure, the underlying micron scale pyramids and the nanometer scale wires. Image by Ryan Chen/LLNL.