Premium
Plasmonically Induced Potential in Metal–Semiconductor Composites
Author(s) -
Shahin Shiva,
Gangopadhyay Palash,
Norwood Robert A.
Publication year - 2016
Publication title -
advanced optical materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.89
H-Index - 91
ISSN - 2195-1071
DOI - 10.1002/adom.201600428
Subject(s) - materials science , indium tin oxide , plasmon , nanoparticle , substrate (aquarium) , semiconductor , surface plasmon resonance , conductive atomic force microscopy , composite material , indium , composite number , nanotechnology , metal , electrical conductor , thin film , optoelectronics , atomic force microscopy , metallurgy , oceanography , geology
Techniques such as conductive atomic force microscopy and electrostatic force microscopy are applied to the study of photoexcited arrays of gold nanoparticles decorating an indium tin oxide coated glass substrate. The nanoparticles are partially covered by a thin semiconducting polymer. The change in the current and potential profiles of the composite metal‐semiconductor sample after excitation at the plasmonic resonance frequency of the metallic nanoparticles is analyzed.