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Wide‐Field Optical Microscopy of Microwave Fields Using Nitrogen‐Vacancy Centers in Diamonds
Author(s) -
Shao Linbo,
Liu Ruishan,
Zhang Mian,
Shneidman Anna V.,
Audier Xavier,
Markham Matthew,
Dhillon Harpreet,
Twitchen Daniel J.,
Xiao YunFeng,
Lončar Marko
Publication year - 2016
Publication title -
advanced optical materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.89
H-Index - 91
ISSN - 2195-1071
DOI - 10.1002/adom.201600039
Subject(s) - microwave , nitrogen vacancy center , materials science , vacancy defect , field (mathematics) , spectroscopy , sensitivity (control systems) , microscopy , diamond , optics , optoelectronics , computer science , physics , nuclear magnetic resonance , telecommunications , electronic engineering , engineering , mathematics , quantum mechanics , pure mathematics , composite material
Real‐time wide‐field optical microscopy and spectroscopy of microwave fields is demonstrated using nitrogen‐vacancy (NV) centers in diamonds. By monitoring electron spin dependent fluorescence of NV centers under a continuous illumination, a microwave field is imaged with an amplitude sensitivity of ≈45 nT Hz −1/2 and a frequency sensitivity of 2.5 kHz Hz −1/2 , across a 200 × 200 μm 2 imaging area with submicrometer spatial resolution.