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Plasmonics: Nanoscale Imaging and Spectroscopy of Plasmonic Modes with the PTIR Technique (Advanced Optical Materials 8/2014)
Author(s) -
Katzenmeyer Aaron M.,
Chae Jungseok,
Kasica Richard,
Holland Glenn,
Lahiri Basudev,
Centrone Andrea
Publication year - 2014
Publication title -
advanced optical materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.89
H-Index - 91
ISSN - 2195-1071
DOI - 10.1002/adom.201470047
Subject(s) - materials science , plasmon , optics , spectroscopy , nanoscopic scale , surface plasmon resonance , absorption (acoustics) , absorption spectroscopy , diffraction , optoelectronics , microscopy , scattering , imaging spectroscopy , nanotechnology , nanoparticle , physics , quantum mechanics , composite material
An atomic force microscopy (AFM) tip is used to provide local absorption maps and spectra of plasmonic resonators in the mid‐IR. On page 718, A. Centrone and co‐workers use photothermally induced resonance (PTIR) to combine the lateral resolution of AFM, enabling the measurement of light absorption at a length scale several times smaller than the light diffraction limit. Since the PTIR signal is not affected by scattering, PTIR spectra are free of Fano spectral distortions typically observed in the far‐field.