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Evidence of the Reverse Intersystem Crossing in Intra‐Molecular Charge‐Transfer Fluorescence‐Based Organic Light‐Emitting Devices Through Magneto‐Electroluminescence Measurements
Author(s) -
Peng Qiming,
Li Weijun,
Zhang Shitong,
Chen Ping,
Li Feng,
Ma Yuguang
Publication year - 2013
Publication title -
advanced optical materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.89
H-Index - 91
ISSN - 2195-1071
DOI - 10.1002/adom.201300028
Subject(s) - intersystem crossing , electroluminescence , materials science , singlet state , oled , optoelectronics , exciton , organic semiconductor , excited state , excimer , fluorescence , atomic physics , condensed matter physics , physics , optics , nanotechnology , layer (electronics)
Experimental evidence for reverse intersystem crossing (RISC) in organic light‐emitting devices with small energy gaps between the singlet and triplet excited states is given using the magnetic field effect (MFE) on the electroluminescence (EL) of the devices. The EL decreases when an external magnetic field is applied, indicating that the RISC process occurs and promotes the exciton in the device. The MFE could be a good tool for exploring physical processes in organic semiconductors, especially when spin effects are involved.