Premium
X‐Ray Detectors: Sensitive and Fast Direct Conversion X‐Ray Detectors Based on Single‐Crystalline HgI 2 Photoconductor and ZnO Nanowire Vacuum Diode (Adv. Mater. Technol. 5/2020)
Author(s) -
Zhang Zhipeng,
Zhang Zhaojun,
Zheng Wei,
Wang Kai,
Chen Huanjun,
Deng Shaozhi,
Huang Feng,
Chen Jun
Publication year - 2020
Publication title -
advanced materials technologies
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.184
H-Index - 42
ISSN - 2365-709X
DOI - 10.1002/admt.202070029
Subject(s) - x ray detector , detector , diode , optoelectronics , materials science , nanowire , sensitivity (control systems) , x ray , electric field , optics , physics , electronic engineering , engineering , quantum mechanics
In article number 1901108, Feng Huang, Jun Chen, and co‐workers design a direct conversion X‐ray detector based on a HgI 2 crystal and a ZnO nanowire vacuum diode to overcome the current runaway effect at high operating electric field and improve the detection sensitivity. The detector shows a sensitivity of 6.8 × 10 3 μCGy air −1 cm −2 and a response time of 0.24 ms. The proposed X‐ray detector is promising for the application of low dose X‐ray detection.