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Surface Bending Strain: Nanoscale Analysis of Surface Bending Strain in Film Substrates for Preventing Fracture in Flexible Electronic Devices (Adv. Mater. Interfaces 5/2021)
Author(s) -
Taguchi Ryo,
Akamatsu Norihisa,
Kuwahara Kohei,
Tokumitsu Kayoko,
Kobayashi Yoshiaki,
Kishino Masayuki,
Yaegashi Keita,
Takeya Jun,
Shishido Atsushi
Publication year - 2021
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.202170026
Subject(s) - materials science , bending , substrate (aquarium) , nanoscopic scale , composite material , strain (injury) , polymer substrate , polymer , nanotechnology , surface (topology) , optoelectronics , medicine , oceanography , geometry , mathematics , geology
How are strains in bending polymer films measured? In article number 2001662 by Norihisa Akamatsu, Jun Takeya, Atsushi Shishido, and co‐workers, the surface‐labeled grating method is proposed for quantitatively measuring the surface bending strain in flexible polymer films. Using this method, the specialty substrate that exhibits small bending strains is designed, enabling the development of mechanically durable flexible electronic devices.