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Ceria: Diffusion of Cation Impurities through Ceria Grain Boundaries (Adv. Mater. Interfaces 20/2020)
Author(s) -
Kwak No Woo,
Lim DaeKwang,
Jeong Seung Jin,
Byeon Pilgyu,
Chung SungYoon,
Jung WooChul
Publication year - 2020
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.202070110
Subject(s) - materials science , grain boundary , crystallite , pulsed laser deposition , impurity , diffusion , thin film , secondary ion mass spectrometry , transition metal , chemical engineering , analytical chemistry (journal) , ion , chemical physics , nanotechnology , composite material , metallurgy , catalysis , microstructure , thermodynamics , chemistry , physics , organic chemistry , engineering , biochemistry , chromatography , quantum mechanics
In article number 2000688, WooChul Jung and co‐workers demonstrate dense polycrystalline thin films of ceria with a very high grain boundary density by pulsed laser deposition (PLD) and assessed the amount of diffused metal along the columnar grain boundaries normal to the surface by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). The observed dynamic behaviors of transition metals present a new perspective on the performance and durability of ceria‐containing applications.