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Sensitive Direct Converting X‐Ray Detectors Utilizing Crystalline CsPbBr 3 Perovskite Films Fabricated via Scalable Melt Processing
Author(s) -
Matt Gebhard J.,
Levchuk Ievgen,
Knüttel Judith,
Dallmann Johannes,
Osvet Andres,
Sytnyk Mykhailo,
Tang Xiaofeng,
Elia Jack,
Hock Rainer,
Heiss Wolfgang,
Brabec Christoph J.
Publication year - 2020
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201901575
Subject(s) - materials science , perovskite (structure) , crystallinity , x ray detector , fabrication , substrate (aquarium) , optoelectronics , detector , diffraction , optics , crystallography , composite material , medicine , chemistry , physics , alternative medicine , oceanography , pathology , geology
Here the fabrication of an inorganic metal‐halide perovskite CsPbBr 3 based X‐ray detector is reported utilizing a simple, scalable, and cost‐sensitive melt processing directly on substrate of any size. X‐ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm 2 range. The CsPbBr 3 film features a resistance of 8.5 GΩ cm and a hole mobility of 18 cm 2 V −1 s −1 . An X‐ray to current conversion rate of 1450 µC Gy air −1 cm −2 at an electric field of 1.2 × 10 4 V cm −1 and a detection limit in the sub µ Gy air s −1 regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr 3 films are suggested to be responsible for a performance which is on par to current state‐of‐the‐art Cd(Zn)Te based X‐ray detector technology.