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In Situ Electrical Properties’ Investigation and Nanofabrication of Ag/Sb 2 Te 3 Assembled Multilayers’ Film
Author(s) -
Wu Zhenhua,
Chen Xiang,
Zhang Yan,
Dun Chaochao,
Carroll David L.,
Hu Zhiyu
Publication year - 2018
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201701210
Subject(s) - materials science , nanolithography , nanotechnology , memristor , layer (electronics) , fabrication , electrical conductor , optoelectronics , scanning tunneling microscope , conductive atomic force microscopy , resistive touchscreen , atomic force microscopy , composite material , medicine , alternative medicine , pathology , electrical engineering , engineering
Nanopatterned fabrication and electrical properties of Ag/Sb 2 Te 3 layer‐by‐layer assembled films are systematically investigated by a conductive atomic force microscope. Multilayers’ film composed by alternating Ag and Sb 2 Te 3 with respective thicknesses of 5 and 10 nm shows a bipolar resistive switching behavior contributed by the silver conductive filaments. Designed cross‐plane nanofilament arrays with reconfigurable patterns are fabricated, which show a potential application in memristor and nanofabrication. Multilayers with the same thickness of Ag but increased thickness of Sb 2 Te 3 (up to 20 nm) present a Fowler–Nordheim tunneling‐dominated current and show in‐plane snowflake silver dendrite on the surface. Further studies on the silver dendrite may bring potential applications in extensive fields such as multifunctional data storage and neuromorphic. By controlling the type (Sb 2 Te 3 , Bi 2 Te 3 , etc.) and thickness of solid electrolyte materials, electronic devices with specific functions and applications can be designed.