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Photovoltaics: Seeing Down to the Bottom: Nondestructive Inspection of All‐Polymer Solar Cells by Kelvin Probe Force Microscopy (Adv. Mater. Interfaces 18/2016)
Author(s) -
Cui Zequn,
Sun Jianxia,
Landerer Dominik,
Sprau Christian,
Thelen Richard,
Colsmann Alexander,
Hölscher Hendrik,
Ma Wanli,
Chi Lifeng
Publication year - 2016
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201670086
Subject(s) - kelvin probe force microscope , materials science , microscopy , photovoltaics , polymer , nanotechnology , atomic force microscopy , composite material , optics , photovoltaic system , physics , engineering , electrical engineering
The material composition in a bulk‐heterojunction of an all‐polymer solar cell is analyzed by Hendrik Hölscher, Wanli Ma, Lifeng Chi, and co‐workers down to the bottom surface by Kelvin probe force microscopy in article 1600446. The phase separation of the composites, both on the top and at the bottom of a BHJ can be measured and reconstructed with this easy‐to‐use approach in a non‐destructive way.