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Seeing Down to the Bottom: Nondestructive Inspection of All‐Polymer Solar Cells by Kelvin Probe Force Microscopy
Author(s) -
Cui Zequn,
Sun Jianxia,
Landerer Dominik,
Sprau Christian,
Thelen Richard,
Colsmann Alexander,
Hölscher Hendrik,
Ma Wanli,
Chi Lifeng
Publication year - 2016
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201600446
Subject(s) - kelvin probe force microscope , materials science , nanotechnology , microscopy , polymer , atomic force microscopy , composite material , optics , physics
The material composition in a bulk heterojunction (BHJ) of an all‐polymer solar cell is analyzed down to the bottom surface by Kelvin probe force microscopy. The phase separation of the composites both on the top and at the bottom of a BHJ can be measured and reconstructed with this easy‐to‐use approach in a nondestructive way.