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Thin Films: Combined Experimental and Computational Methods Reveal the Evolution of Buried Interfaces during Synthesis of Ferroelectric Thin Films (Adv. Mater. Interfaces 10/2015)
Author(s) -
Jones Jacob L.,
LeBeau James M.,
Nikkel Jason,
Oni Adedapo A.,
Dycus J. Houston,
Cozzan Clayton,
Lin FangYin,
Chernatynskiy Aleksandr,
Nino Juan C.,
Sinnott Susan B.,
Mhin Sungwook,
Brennecka Geoff L.,
Ihlefeld Jon
Publication year - 2015
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201570048
Subject(s) - materials science , thin film , lead zirconate titanate , ferroelectricity , nucleation , transmission electron microscopy , diffraction , oxide , scanning electron microscope , nanotechnology , optoelectronics , composite material , optics , metallurgy , dielectric , chemistry , physics , organic chemistry
Scanning transmission electron microscopy is utilized to reveal atomic‐level interactions that occur during thermal processing at thin film oxide‐metal interfaces, as described by J. L. Jones and co‐workers in article 1500181. These observations, combined with in situ X‐ray diffraction and theoretical techniques, are used to determine how solution‐processed lead zirconate titanate (PZT) films nucleate on Pt electrodes, results that will guide future ferroelectric film processing.