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Electron Scattering: Nature of Electron Scattering in LaAlO 3 /SrTiO 3 Interfaces Near the Critical Thickness (Adv. Mater. Interfaces 1/2015)
Author(s) -
Li C. J.,
Lü W. M.,
Wang X. Renshaw,
Qiu X. P.,
Sun L.,
Zeng S. W.,
Liu Z. Q.,
Huang Z.,
Zhao Y. L.,
Venkatesan T.
Publication year - 2015
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201570001
Subject(s) - materials science , percolation (cognitive psychology) , scattering , condensed matter physics , electron scattering , electron , layer (electronics) , oxide , perovskite (structure) , nanotechnology , optics , crystallography , physics , chemistry , quantum mechanics , neuroscience , metallurgy , biology
M. Lü, T. Venkatesan, and co‐workers demonstrate in article 1400437 the percolation of two dimensional electron gases (2DEG) at the LaAlO 3 /SrTiO 3 perovskite oxide interface. The fourth unit cell islands on top of a uniformly plane of a three unit cell of a LaAlO 3 film generate 2DEG in the underneath SrTiO 3 layer locally. When the island coverage ratio reaches a critical value of ca. 65%, 2DEG islands percolate to form a continuous conducting network.