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Structural and Electronic Heterogeneity of Two Dimensional Amorphous Silica Layers
Author(s) -
Altman Eric I.,
Schwarz Udo D.
Publication year - 2014
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201400108
Subject(s) - bridging (networking) , materials science , tetrahedron , amorphous solid , amorphous silica , crystallography , chemical physics , ring (chemistry) , nanotechnology , chemical engineering , chemistry , computer science , engineering , computer network , organic chemistry
STM of amorphous silica bilayers reveals electronic heterogeneity between seemingly identical sites. The structure is constructed of 4–9 membered rings of corner sharing SiO 4 tetrahedra. Certain oxygens bridging the larger rings vanish as the bias voltage is reduced while others bridging the same size rings are unaffected. The variation highlights the role of ring distortions in determining the local properties of this new 2D material.