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Precise Evaluation of Angstrom‐Ordered Mixed Interfaces in Solution‐Processed OLEDs by Neutron Reflectometry
Author(s) -
Ohisa Satoru,
Matsuba Go,
Yamada Norifumi L.,
Pu YongJin,
Sasabe Hisahiro,
Kido Junji
Publication year - 2014
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201400097
Subject(s) - neutron reflectometry , reflectometry , materials science , layer (electronics) , interface (matter) , angstrom , oled , neutron , optoelectronics , infrared , computer science , nanotechnology , crystallography , physics , optics , chemistry , neutron scattering , composite material , capillary action , computer vision , quantum mechanics , time domain , capillary number , small angle neutron scattering
The interfaces between hole‐transporting polymer (TFB) and the emitting small molecules (CBP: Ir(ppy) 3 ) in OLEDs are investigated using neutron reflectometry. The interface with the evaporated CBP: Ir(ppy) 3 layer is clear. On the other hand, the interface with the spin‐coated CBP: Ir(ppy) 3 layer is broad, and the CBP: Ir(ppy) 3 disperses into the TFB layer. The mixing ratio of CBP is larger than that of Ir(ppy) 3 . The influences of the interfaces on the hole only device characteristics are investigated.