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Synthesis and Characterization of Layered Tin Monoxide Thin Films with Monocrystalline Structure on III–V Compound Semiconductor
Author(s) -
Laukkanen Pekka,
Lång Jouko,
Punkkinen Marko,
Kuzmin Mikhail,
Tuominen Marjukka,
Yasir Muhammad,
Dahl Johnny,
Tuominen Veikko,
Kokko Kalevi,
Polojärvi Ville,
Salmi Joel,
Korpijärvi VilleMarkus,
Aho Arto,
Tukiainen Antti,
Guina Mircea,
Hedman HannuPekka,
Punkkinen Risto
Publication year - 2014
Publication title -
advanced materials interfaces
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.671
H-Index - 65
ISSN - 2196-7350
DOI - 10.1002/admi.201300022
Subject(s) - materials science , monocrystalline silicon , characterization (materials science) , semiconductor , substrate (aquarium) , thin film , tin , diffraction , deposition (geology) , nanotechnology , optoelectronics , silicon , optics , metallurgy , paleontology , oceanography , physics , sediment , geology , biology
Synthesis of layered SnO with a monocrystalline structure on a semiconductor substrate is demonstrated using a vacuum deposition method as well as diffraction, microscopy, and spectroscopy characterization.