z-logo
Premium
Fractional Diffusion in Silicon
Author(s) -
Zijlstra Eeuwe S.,
Kalitsov Alan,
Zier Tobias,
Garcia Martin E.
Publication year - 2013
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma201302559
Subject(s) - materials science , silicon , diffusion , chemical physics , semiconductor , molecule , molecular dynamics , ab initio , atomic units , nanotechnology , molecular physics , computational chemistry , thermodynamics , optoelectronics , organic chemistry , quantum mechanics , chemistry , physics
Microscopic processes leading to ultrafast laser‐induced melting of silicon are investigated by large‐scale ab initio molecular dynamics simulations. Before becoming a liquid, the atoms are shown to be fractionally diffusive, which is a property that has so far been observed in crowded fluids consisting of large molecules. Here, it is found to occur in an elemental semiconductor.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here