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Imaging and Controlling Photonic Modes in Perovskite Microcavities
Author(s) -
Liu Wei,
Li Yaolong,
Yu Haoran,
Wang Ju,
Hu Aiqin,
Jia Shangtong,
Li Xiaofang,
Yang Hong,
Dai Lun,
Lu Guowei,
Liu Yunquan,
Wang Shufeng,
Gong Qihuang
Publication year - 2021
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.202100775
Subject(s) - materials science , optoelectronics , photonics , polarization (electrochemistry) , polariton , perovskite (structure) , optics , nanophotonics , transverse plane , photonic crystal , excitation , exciton , exciton polaritons , physics , condensed matter physics , chemistry , structural engineering , quantum mechanics , chemical engineering , engineering
Abstract Perovskite microcavities have excellent photophysical properties for integrated optoelectronic devices, such as nanolasers. Imaging and controlling the photonic modes within the cavity are fundamentally important to understand and develop applications. Here, photoemission electron microscopy (PEEM) is used to image the photonic modes within optical microcavities with a nanometer‐scale spatial resolution. From a CsPbBr 3 microcavity, hybrid mode patterns are observed. Spatial frequency spectrum analysis on the patterns uncovers the characteristic cavity modes, which are modeled with transverse magnetic (TM) and transverse electric (TE) waves, and assigned to exciton–polariton modes. Based on this understanding, the light focus in a designed microcavity is imaged in real space and controlled by the light field polarization. The study confirms that the cavity modes in perovskites can be effectively observed by the PEEM technique under resonant excitation, which, in turn, promotes the design of optoelectronic devices based on perovskite microcavities.