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PbS Quantum Dots: Carrier Multiplication in PbS Quantum Dots Anchored on a Au Tip using Conductive Atomic Force Microscopy (Adv. Mater. 17/2020)
Author(s) -
Kim SungTae,
Kim JiHee,
Lee Young Hee
Publication year - 2020
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.202070130
Subject(s) - quantum dot , photocurrent , materials science , conductive atomic force microscopy , optoelectronics , photoconductive atomic force microscopy , multiple exciton generation , nanotechnology , band gap , electrical conductor , atomic force microscopy , multiplication (music) , physics , scanning electron microscope , composite material , scanning capacitance microscopy , scanning confocal electron microscopy , acoustics
In article number 1908461, Ji‐Hee Kim, Young Hee Lee, and Sung‐Tae Kim demonstrate highly efficient carrier multiplication via photocurrent measurements using a PbS‐quantum‐dot‐decorated tip of a conductive atomic force microscope (CAFM), leading to the lowest threshold energy of twice the bandgap in PbS quantum dots. The CAFM‐based photocurrent technique is a direct approach for evaluating the CM efficiency in low‐dimensional materials.