Premium
PbS Quantum Dots: Carrier Multiplication in PbS Quantum Dots Anchored on a Au Tip using Conductive Atomic Force Microscopy (Adv. Mater. 17/2020)
Author(s) -
Kim SungTae,
Kim JiHee,
Lee Young Hee
Publication year - 2020
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.202070130
Subject(s) - quantum dot , photocurrent , materials science , conductive atomic force microscopy , optoelectronics , photoconductive atomic force microscopy , multiple exciton generation , nanotechnology , band gap , electrical conductor , atomic force microscopy , multiplication (music) , physics , scanning electron microscope , composite material , scanning capacitance microscopy , scanning confocal electron microscopy , acoustics
In article number 1908461, Ji‐Hee Kim, Young Hee Lee, and Sung‐Tae Kim demonstrate highly efficient carrier multiplication via photocurrent measurements using a PbS‐quantum‐dot‐decorated tip of a conductive atomic force microscope (CAFM), leading to the lowest threshold energy of twice the bandgap in PbS quantum dots. The CAFM‐based photocurrent technique is a direct approach for evaluating the CM efficiency in low‐dimensional materials.
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom