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Facile Morphological Qualification of Transferred Graphene by Phase‐Shifting Interferometry
Author(s) -
Lee Ukjae,
Woo Yun Sung,
Han Yoojoong,
Gutiérrez Humberto R.,
Kim Un Jeong,
Son Hyungbin
Publication year - 2020
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.202002854
Subject(s) - graphene , materials science , raman spectroscopy , nanomaterials , nanotechnology , characterization (materials science) , interferometry , fabrication , chemical vapor deposition , surface finish , nanoscopic scale , optoelectronics , optics , composite material , medicine , physics , alternative medicine , pathology
Post‐growth graphene transfer to a variety of host substrates for circuitry fabrication has been among the most popular subjects since its successful development via chemical vapor deposition in the past decade. Fast and reliable evaluation tools for its morphological characteristics are essential for the development of defect‐free transfer protocols. The implementation of conventional techniques, such as Raman spectroscopy, atomic force microscopy (AFM), and transmission electron microscopy in production quality control at an industrial scale is difficult because they are limited to local areas, are time consuming, and their operation is complex. However, through a one‐shot measurement within a few seconds, phase‐shifting interferometry (PSI) successfully scans ≈1 mm 2 of transferred graphene with a vertical resolution of ≈0.1 nm. This provides crucial morphological information, such as the surface roughness derived from polymer residues, the thickness of the graphene, and its adhesive strength with respect to the target substrates. Graphene samples transferred via four different methods are evaluated using PSI, Raman spectroscopy, and AFM. Although the thickness of the nanomaterials measured by PSI can be highly sensitive to their refractive indices, PSI is successfully demonstrated to be a powerful tool for investigating the morphological characteristics of the transferred graphene for industrial and research purposes.