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Hollow Nanostructures: Electron Tomography: A Unique Tool Solving Intricate Hollow Nanostructures (Adv. Mater. 38/2019)
Author(s) -
Song Hao,
Yang Yannan,
Geng Jing,
Gu Zhengying,
Zou Jin,
Yu Chengzhong
Publication year - 2019
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201970272
Subject(s) - materials science , electron tomography , nanostructure , characterization (materials science) , nanotechnology , electron microscope , tomography , transmission electron microscopy , optics , scanning transmission electron microscopy , physics
In article number 1801564, Jin Zou, Chengzhong Yu, and co‐workers showcase the exceptional characterization capability of electron tomography (ET) toward intricate hollow nanostructures. As a unique and powerful toolkit, ET reveals both structural and compositional information that cannot be obtained from conventional electron microscopy analysis, reflecting genuine architectures of 3D nano‐objects.