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Synergistic Effect of Elevated Device Temperature and Excess Charge Carriers on the Rapid Light‐Induced Degradation of Perovskite Solar Cells
Author(s) -
Chen Bo,
Song Jingfeng,
Dai Xuezeng,
Liu Ye,
Rudd Peter N.,
Hong Xia,
Huang Jinsong
Publication year - 2019
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201902413
Subject(s) - materials science , perovskite (structure) , degradation (telecommunications) , charge carrier , energy conversion efficiency , photothermal therapy , optoelectronics , carrier lifetime , open circuit voltage , limiting , chemical engineering , nanotechnology , voltage , silicon , electrical engineering , engineering , mechanical engineering
With power conversion efficiencies now reaching 24.2%, the major factor limiting efficient electricity generation using perovskite solar cells (PSCs) is their long‐term stability. In particular, PSCs have demonstrated rapid degradation under illumination, the driving mechanism of which is yet to be understood. It is shown that elevated device temperature coupled with excess charge carriers due to constant illumination is the dominant force in the rapid degradation of encapsulated perovskite solar cells under illumination. Cooling the device to 20 °C and operating at the maximum power point improves the stability of CH 3 NH 3 PbI 3 solar cells over 100× compared to operation under open circuit conditions at 60 °C. Light‐induced strain originating from photothermal‐induced expansion is also observed in CH 3 NH 3 PbI 3 , which excludes other light‐induced‐strain mechanisms. However, strain and electric field do not appear to play any role in the initial rapid degradation of CH 3 NH 3 PbI 3 solar cells under illumination. It is revealed that the formation of additional recombination centers in PSCs facilitated by elevated temperature and excess charge carriers ultimately results in rapid light‐induced degradation. Guidance on the best methods for measuring the stability of PSCs is also given.