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Highly In‐Plane Anisotropic 2D GeAs 2 for Polarization‐Sensitive Photodetection
Author(s) -
Li Liang,
Gong Penglai,
Sheng Daopeng,
Wang Shuao,
Wang Weike,
Zhu Xiangde,
Shi Xingqiang,
Wang Fakun,
Han Wei,
Yang Sanjun,
Liu Kailang,
Li Huiqiao,
Zhai Tianyou
Publication year - 2018
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201804541
Subject(s) - photodetection , materials science , anisotropy , polarization (electrochemistry) , semiconductor , photodetector , optoelectronics , condensed matter physics , monolayer , optics , nanotechnology , physics , chemistry
Due to the intriguing anisotropic optical and electrical properties, low‐symmetry 2D materials are attracting a lot of interest both for fundamental studies and fabricating novel electronic and optoelectronic devices. Identifying new promising low‐symmetry 2D materials will be rewarding toward the evolution of nanoelectronics and nano‐optoelectronics. In this work, germanium diarsenide (GeAs 2 ), a group IV–V semiconductor with novel low‐symmetry puckered structure, is introduced as a favorable highly anisotropic 2D material into the rapidly growing 2D family. The structural, vibrational, electrical, and optical in‐plane anisotropy of GeAs 2 is systematically investigated both theoretically and experimentally, combined with thickness‐dependent studies. Polarization‐sensitive photodetectors based on few‐layer GeAs 2 exhibit highly anisotropic photodetection behavior with lineally dichroic ratio up to ≈2. This work on GeAs 2 will excite interests in the less exploited regime of group IV–V compounds.