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Oxygen Diode Formed in Nickelate Heterostructures by Chemical Potential Mismatch
Author(s) -
Guo ErJia,
Liu Yaohua,
Sohn Changhee,
Desautels Ryan D.,
Herklotz Andreas,
Liao Zhaoliang,
Nichols John,
Freeland John W.,
Fitzsimmons Michael R.,
Lee Ho Nyung
Publication year - 2018
Publication title -
advanced materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 10.707
H-Index - 527
eISSN - 1521-4095
pISSN - 0935-9648
DOI - 10.1002/adma.201705904
Subject(s) - materials science , x ray photoelectron spectroscopy , oxygen , chemical state , lanio , heterojunction , thin film , perovskite (structure) , oxide , pulsed laser deposition , absorption spectroscopy , chemical bath deposition , x ray absorption spectroscopy , transition metal , analytical chemistry (journal) , optoelectronics , nanotechnology , chemical engineering , optics , ferroelectricity , catalysis , chemistry , physics , organic chemistry , biochemistry , chromatography , engineering , metallurgy , dielectric
Deliberate control of oxygen vacancy formation and migration in perovskite oxide thin films is important for developing novel electronic and iontronic devices. Here, it is found that the concentration of oxygen vacancies (V O ) formed in LaNiO 3 (LNO) during pulsed laser deposition is strongly affected by the chemical potential mismatch between the LNO film and its proximal layers. Increasing the V O concentration in LNO significantly modifies the degree of orbital polarization and drives the metal–insulator transition. Changes in the nickel oxidization state and carrier concentration in the films are confirmed by soft X‐ray absorption spectroscopy and optical spectroscopy. The ability to unidirectional‐control the oxygen flow across the heterointerface, e.g., a so‐called “oxygen diode”, by exploiting chemical potential mismatch at interfaces provides a new avenue to tune the physical and electrochemical properties of complex oxides.

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